Computerized c–v meter
| Category | Education |
| Serial Number | model 4108 |
| Department | Physics |
| Calibration Status | not_specified |
| Device Type | measuring |
| Device Status | working |
| Maintenance Type | no_maintenance |
| Device Brand | Inc. Pittsburgh |
| Count of Devices | 1 |
| Device Description | Capacitance–voltage profiling (or C–V profiling, sometimes CV profiling) is a technique for characterizing semiconductor materials and devices. The applied voltage is varied, and the capacitance is measured and plotted as a function of voltage. The techni |
| Device Function | computerized C-V Measurements |
| Device Guarantee | no |
| Laboratory Name | Central Lab of Physics |
| Responsible Person | Prof. Dr. Helmy Taha Elshaer |